SOC-Test System - PR1251693-2270-W
SOC-Testsystem - PR1251693-2270-W
Germany · München
What the buyer is looking for
This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with an industrial standard wafer probing system as well as with an industrial standard device handling system. The test system has to be compatible in Hard- and Software to an already existing Advantest V93000 test system in the Fraunhofer-Gesellschaft.
Description as published (DE).
Contract
BuyerFraunhofer-Gesellschaft, Einkauf B12
TypeSupplies
Estimated valuevalue not published
Published7 August 2026
CategoryElectrical machinery · CPV 31000000
Who has won here before
| Company | Awards | Period |
|---|---|---|
| Keysight Technologies | 39 | 2022–2026 |
| EV Group E. Thallner GmbH · Neuhaus am Inn | 23 | 2024–2026 |
| SUSS MicroTec Solutions GmbH & Co. KG | 19 | 2023–2026 |
| Rigaku Europe SE | 16 | 2023–2025 |
| Evatec Europe GmbH · Aschheim, Ortsteil Dornach | 15 | 2023–2026 |
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18
days until the deadline — Monday 7 September at 08:00
How to bid
Read the full notice — Original + documents
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